English

Monovacancy and Substitutional Defects in Hexagonal Silicon Nanotubes

Materials Science 2007-09-11 v1

Abstract

We present a first-principle study of geometrical and electronic structure of hexagonal single-walled silicon nanotubes with a monovacancy or a substitutional defect. The C, Al or P atoms are chosen as substitutional impurities. It is found that the defect such as a monovacancy or a substitutional impurity results in deformation of the hexagonal single-walled silicon nanotube. In both cases, a relatively localized unoccupied state near the Fermi level occurs due to this local deformation. The difference in geometrical and electronic properties of different substitutional impurities is discussed.

Keywords

Cite

@article{arxiv.0709.1299,
  title  = {Monovacancy and Substitutional Defects in Hexagonal Silicon Nanotubes},
  author = {Gunn Kim and Suklyun Hong},
  journal= {arXiv preprint arXiv:0709.1299},
  year   = {2007}
}

Comments

5 figures

R2 v1 2026-06-21T09:15:28.688Z