Metallized Film Capacitor Lifetime Evaluation and Failure Mode Analysis
Accelerator Physics
2016-07-07 v1 Instrumentation and Detectors
Abstract
One of the main concerns for power electronic engineers regarding capacitors is to predict their remaining lifetime in order to anticipate costly failures or system unavailability. This may be achieved using a Weibull statistical law combined with acceleration factors for the temperature, the voltage, and the humidity. This paper discusses the different capacitor failure modes and their effects and consequences.
Cite
@article{arxiv.1607.01540,
title = {Metallized Film Capacitor Lifetime Evaluation and Failure Mode Analysis},
author = {R. Gallay},
journal= {arXiv preprint arXiv:1607.01540},
year = {2016}
}
Comments
12 pages, contribution to the 2014 CAS - CERN Accelerator School: Power Converters, Baden, Switzerland, 7-14 May 2014