Low-Temperature Resistivity Anomalies in Periodic Curved Surfaces
Mesoscale and Nanoscale Physics
2015-05-14 v1
Abstract
Effects of periodic curvature on the the electrical resistivity of corrugated semiconductor films are theoretically considered. The presence of a curvature-induced potential affects the motion of electrons confined to the thin curved film, resulting in a significant resistivity enhancement at specific values of two geometric parameters: the amplitude and period of the surface corrugation. The maximal values of the two parameters in order to observe the corrugation-induced resistivity enhancement in actual experiments are quantified by employing existing material constants.
Keywords
Cite
@article{arxiv.0909.1135,
title = {Low-Temperature Resistivity Anomalies in Periodic Curved Surfaces},
author = {Shota Ono and Hiroyuki Shima},
journal= {arXiv preprint arXiv:0909.1135},
year = {2015}
}
Comments
4 pages, 5 figures