Measurement of the endpoints of X-ray spectra emitted from RF cavities is a useful non-invasive technique for measuring peak voltages within the cavities. The matching of calculated X-ray spectra to measured spectra is described, with emphasis upon the endpoint region.
@article{arxiv.physics/0008024,
title = {Measurements of RF Cavity Voltages by X-ray Spectrum Measurements},
author = {J. P. Duke and A. P. Letchford and D. J. S. Findlay},
journal= {arXiv preprint arXiv:physics/0008024},
year = {2007}
}
Comments
For LINAC 2000 Conference, Monterey, 21-25 August 2000 Paper no. MOC08 Second PostScript version to replace first PostScript version in which caption to Fig. 1 overflowed on to second page