Measurements of diode dynamic conductance and dynamic capacitance for frequencies up to 10×τp,n−1, and voltage amplitude level up tp 100 mV was carried out with a precision impedancemeter. The results were compared with the theoretical expressions obtained with the spectral approach to the charge carrier transport in p−n-junctions. This experimental confirmation is of practical interest, as one can use the theory to extract device parameters, such as: relaxation time τp,n, and junction injection coefficient. These experiments were carried to test the extension of the conventional p−n-junction theory.
@article{arxiv.2011.13878,
title = {Measurement of $p\!-\!n$-junction diode behavior under large signal and high frequency},
author = {Maria Augusta R. B. L. Fernandes and Edval J. P. Santos},
journal= {arXiv preprint arXiv:2011.13878},
year = {2020}
}
Comments
7 pages, 7 figures, International Symposium on Microelectronics Technology and Devices, 2014, Aracaju, Brasil. Proceedings of the SBMicro 2014, 2014