Measurement of deep-subwavelength emitter separation in a waveguide-QED system

Zeyang Liao; M. Al-Amri; M. Suhail. Zubairy

doi:10.1364/OE.25.031997

Measurement of deep-subwavelength emitter separation in a waveguide-QED system

Quantum Physics 2018-02-14 v1

Authors: Zeyang Liao , M. Al-Amri , M. Suhail. Zubairy

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Abstract

In the waveguide quantum electrodynamics (QED) system, emitter separation plays an important role for its functionality. Here, we present a method to measure the deep-subwavelength emitter separation in a waveguide-QED system. In this method, we can also determine the number of emitters within one diffraction-limited spot. In addition, we also show that ultrasmall emitter separation change can be detected in this system which may then be used as a waveguide-QED-based sensor to measure tiny local temperature/strain variation.

Keywords

waveguide QED emitter separation deep-subwavelength quantum electrodynamics diffraction-limited spot sensor temperature/strain variation

Cite

@article{arxiv.1707.04845,
  title  = {Measurement of deep-subwavelength emitter separation in a waveguide-QED system},
  author = {Zeyang Liao and M. Al-Amri and M. Suhail. Zubairy},
  journal= {arXiv preprint arXiv:1707.04845},
  year   = {2018}
}

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