English

Long Term Logarithmic Annealing in p-MNOS RADFETs and Renormalization of Relaxation Parameters

Applied Physics 2019-06-24 v1 Nuclear Experiment Instrumentation and Detectors Space Physics

Abstract

It was experimentally shown that annealing (fading) of the pMNOS based dosimeters has close to logarithmic temporal dependence during and after irradiation. The results are shown to be consistent with the previously proposed model.

Keywords

Cite

@article{arxiv.1906.09215,
  title  = {Long Term Logarithmic Annealing in p-MNOS RADFETs and Renormalization of Relaxation Parameters},
  author = {G. I. Zebrev and P. A. Zimin and E. V. Mrozovskaya and V. A. Yushkova and V. S. Anashin and P. A. Chubunov},
  journal= {arXiv preprint arXiv:1906.09215},
  year   = {2019}
}

Comments

3 pages, 4 figures