The non-linear length-dependent resistance, R(l) observed in single-wall Carbon nanotubes (SNTs) is explained through the recently proposed ionization energy (EI) based Fermi-Dirac statistics (iFDS). The length here corresponds to the Carbon atoms number (N) along the SNT. It is also shown that Ry(ly)<Rx(lx) is associated with EIy<EIx, which can be attributed to different semiconducting properties in their respective y and x directions.
@article{arxiv.cond-mat/0501008,
title = {Length-dependent resistance model for a single-wall Carbon nanotube},
author = {Andrew Das Arulsamy and Marco Fronzi},
journal= {arXiv preprint arXiv:cond-mat/0501008},
year = {2015}
}