Lattice Misfit Measurement in Inconel 625 by X-Ray Diffraction Technique

P. Mukherjee; A. Sarkar; P. Barat; T. Jayakumar; S. Mahadevan; Sanjay K. Rai

Lattice Misfit Measurement in Inconel 625 by X-Ray Diffraction Technique

Materials Science 2007-05-23 v1

Authors: P. Mukherjee , A. Sarkar , P. Barat , T. Jayakumar , S. Mahadevan , Sanjay K. Rai

Abstract

Determination of lattice misfit and microstructural parameters of the coherent precipitates in Ni based alloy Inconel-625 is a challenging problem as their peaks are completely overlapping among themselves and also with the matrix. We have used a novel X-ray diffraction technique on the bulk samples of Inconel 625 at different heat-treated conditions to determine the lattice parameters, the lattice misfit of the coherent precipitates with the matrix and their microstructural parameters like size and strain.

Keywords

lattice misfit X-ray diffraction Inconel 625 coherent precipitates microstructural parameters

Cite

@article{arxiv.cond-mat/0604222,
  title  = {Lattice Misfit Measurement in Inconel 625 by X-Ray Diffraction Technique},
  author = {P. Mukherjee and A. Sarkar and P. Barat and T. Jayakumar and S. Mahadevan and Sanjay K. Rai},
  journal= {arXiv preprint arXiv:cond-mat/0604222},
  year   = {2007}
}

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