Laser Scanning Microscopy of HTS Films and Devices

A. P. Zhuravel; A. G. Sivakov; O. G. Turutanov; A. N. Omelyanchouk; Steven M. Anlage; A. V. Ustinov

doi:10.1063/1.2215376

Laser Scanning Microscopy of HTS Films and Devices

Superconductivity 2009-09-14 v1 Materials Science

Authors: A. P. Zhuravel , A. G. Sivakov , O. G. Turutanov , A. N. Omelyanchouk , Steven M. Anlage , A. V. Ustinov

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Abstract

The work describes the capabilities of Laser Scanning Microscopy (LSM) as a spatially resolved method of testing high_Tc materials and devices. The earlier results obtained by the authors are briefly reviewed. Some novel applications of the LSM are illustrated, including imaging the HTS responses in rf mode, probing the superconducting properties of HTS single crystals, development of twobeam laser scanning microscopy. The existence of the phase slip lines mechanism of resistivity in HTS materials is proven by LSM imaging.

Keywords

laser scanning microscopy high-temperature superconductors HTS films phase slip lines spatially resolved imaging

Cite

@article{arxiv.cond-mat/0512582,
  title  = {Laser Scanning Microscopy of HTS Films and Devices},
  author = {A. P. Zhuravel and A. G. Sivakov and O. G. Turutanov and A. N. Omelyanchouk and Steven M. Anlage and A. V. Ustinov},
  journal= {arXiv preprint arXiv:cond-mat/0512582},
  year   = {2009}
}

Comments

17 pages, 21 figures, Submitted to Fizika Nizkikh Temperatur (Low Temperature Physics)

Laser Scanning Microscopy of HTS Films and Devices

Abstract

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