We report on magnetotransport investigations of nano-scaled ferromagnetic Co/Ni/Co single electron transistors. As a result of reduced size, the devices exhibit single electron transistor characteristics at 4.2K. Magnetotransport measurements carried out at 1.8K reveal tunneling magnetoresistance (TMR) traces with negative coercive fields, which we interpret in terms of a switching mechanism driven by the shape anisotropy of the central wire-like Ni island. A large TMR of about 18% is observed within a finite source-drain bias regime. The TMR decreases rapidly with increasing bias, which we tentatively attribute to excitation of magnons in the central island.
@article{arxiv.cond-mat/0702370,
title = {Large Magnetoresistance in Co/Ni/Co Ferromagnetic Single Electron Transistors},
author = {R. S. Liu and H. Pettersson and L. Michalak and C. M. Canali and D. Suyatin and L. Samuelson},
journal= {arXiv preprint arXiv:cond-mat/0702370},
year = {2007}
}
Comments
12 pages (including 4 figures). Accepted for publishing on APL