Kossel interferences of proton-induced X-ray emission lines in periodic multilayers
Abstract
The Kossel interferences generated by characteristic x-ray lines produced inside a periodic multilayer have been observed upon proton irradiation, by submitting a Cr/B4C/Sc multilayer stack to 2 MeV protons and observing the intensity of the Sc and Cr K characteristic emissions as a function of the detection angle. When this angle is close to the Bragg angle corresponding to the emission wavelength and period of the multilayer, an oscillation of the measured intensity is detected. The results are in good agreement with a model based on the reciprocity theorem. The combination of the Kossel measurements and their simulation, will be a useful tool to obtain a good description of the multilayer stack and thus to study nanometer-thick layers and their interfaces.
Keywords
Cite
@article{arxiv.1612.02140,
title = {Kossel interferences of proton-induced X-ray emission lines in periodic multilayers},
author = {Meiyi Wu and Karine Le Guen and Jean-Michel André and Vita Ilakovac and Ian Vickridge and Didier Schmaus and Emrick Briand and Sébastien Steydli and Catherine Burcklen and Françoise Bridou and Evgueni Meltchakov and Sébastien De Rossi and Franck Delmotte and Philippe Jonnard},
journal= {arXiv preprint arXiv:1612.02140},
year = {2016}
}