English

Impurity impact ionization avalanche in p-type diamond

Materials Science 2012-10-04 v1

Abstract

Electrical conductivity of a highly boron doped chemical vapor deposited diamond thin film has been studied at different temperatures under high electric field conditions. Current-voltage characteristics have been measured using pulsed technique to reduce thermal effects. Experimental results evidence deep impurity impact ionization avalanche in p-type diamond up to room temperature.

Keywords

Cite

@article{arxiv.1210.0993,
  title  = {Impurity impact ionization avalanche in p-type diamond},
  author = {Vincent Mortet and A. Soltani},
  journal= {arXiv preprint arXiv:1210.0993},
  year   = {2012}
}
R2 v1 2026-06-21T22:15:10.236Z