Extended x-ray absorption fine-structure (EXAFS) data collected in the fluorescence mode are susceptible to an apparent amplitude reduction due to the self-absorption of the fluorescing photon by the sample before it reaches a detector. Previous treatments have made the simplifying assumption that the effect of the EXAFS on the correction term is negligible, and that the samples are in the thick limit. We present a nearly exact treatment that can be applied for any sample thickness or concentration, and retains the EXAFS oscillations in the correction term.
@article{arxiv.cond-mat/0306252,
title = {Improved self-absorption correction for fluorescence measurements of extended x-ray absorption fine-structure},
author = {C. H. Booth and F. Bridges},
journal= {arXiv preprint arXiv:cond-mat/0306252},
year = {2007}
}
Comments
3 pages, 3 figure (eps), submitted to The 12th International Conference on X-Ray Absorption Fine Structure (XAFS XII)