Identifying structural order in Selenium with Near-Edge Spectroscopy

J. A. McLeod; N. Chen; R. E. Johanson; G. Belev; D. Tonchev; A. Moewes; S. O. Kasap

Identifying structural order in Selenium with Near-Edge Spectroscopy

Materials Science 2009-10-07 v1

Authors: J. A. McLeod , N. Chen , R. E. Johanson , G. Belev , D. Tonchev , A. Moewes , S. O. Kasap

Abstract

We investigate the crystallization of amorphous arsenic-selenium alloys with 0%, 0.5%, 2%, 6%, 10%, and 19% arsenic by atomic concentration using synchrotron X-ray absorption spectroscopy. We identify crystalline order using the extended X-ray absorption fine structure (EXAFS) spectra and correlate this order to changes in features of the X-ray absorption near edge structure (XANES) spectra. We find supporting evidence that the structure of amorphous selenium is composed of disordered helical chains, and is therefore closer to the trigonal crystalline phase than the monoclinic crystalline phase.

Keywords

crystal structure and quasicrystals surface science

Cite

@article{arxiv.0910.1051,
  title  = {Identifying structural order in Selenium with Near-Edge Spectroscopy},
  author = {J. A. McLeod and N. Chen and R. E. Johanson and G. Belev and D. Tonchev and A. Moewes and S. O. Kasap},
  journal= {arXiv preprint arXiv:0910.1051},
  year   = {2009}
}

Comments

4 pages, 4 figures

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