Near-edge x-ray absorption fine structure investigation of graphene

D. Pacilé; M. Papagno; A. Fraile Rodríguez; M. Grioni; L. Papagno; Ç. Ö. Girit; J. C. Meyer; G. E. Begtrup; A. Zettl

doi:10.1103/PhysRevLett.101.066806

Near-edge x-ray absorption fine structure investigation of graphene

Materials Science 2009-11-13 v1

Authors: D. Pacilé , M. Papagno , A. Fraile Rodríguez , M. Grioni , L. Papagno , Ç. Ö. Girit , J. C. Meyer , G. E. Begtrup , A. Zettl

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Abstract

We report the near-edge x-ray absorption fine structure (NEXAFS) spectrum of a single layer of graphite (graphene) obtained by micromechanical cleavage of Highly Ordered Pyrolytic Graphite (HOPG) on a SiO2 substrate. We utilized a PhotoEmission Electron Microscope (PEEM) to separately study single- double- and few-layers graphene (FLG) samples. In single-layer graphene we observe a splitting of the pi* resonance and a clear signature of the predicted interlayer state. The NEXAFS data illustrate the rapid evolution of the electronic structure with the increased number of layers.

Keywords

graphene near-edge x-ray absorption fine structure NEXAFS photoemission electron microscope PEEM electronic structure pi* resonance interlayer state

Cite

@article{arxiv.0805.2269,
  title  = {Near-edge x-ray absorption fine structure investigation of graphene},
  author = {D. Pacilé and M. Papagno and A. Fraile Rodríguez and M. Grioni and L. Papagno and Ç. Ö. Girit and J. C. Meyer and G. E. Begtrup and A. Zettl},
  journal= {arXiv preprint arXiv:0805.2269},
  year   = {2009}
}

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5 pages, 4 figures

Near-edge x-ray absorption fine structure investigation of graphene

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