A new class of models based on hysteresis functions is developed to describe atomic force microscopes operating in dynamic mode. Such models are able to account for dissipative phenomena in the tip-sample interaction which are peculiar of this operation mode. The model analysis, which can be pursued using frequency domain techniques, provides a clear insight of specific nonlinear behaviours. Experiments show good agreement with the identified models.
@article{arxiv.0710.3922,
title = {Hysteresis Models of Dynamic Mode Atomic Force Microscopes: Analysis and Identification},
author = {Michele Basso and Donatello Materassi and Murti V. Salapaka},
journal= {arXiv preprint arXiv:0710.3922},
year = {2007}
}