Wavefront-marking X-ray imaging techniques use e.g., sandpaper or a grating to generate intensity fluctuations, and analyze their distortion by the sample in order to retrieve attenuation, phase-contrast, and dark-field information. Phase contrast yields an improved visibility of soft-tissue specimens, while dark-field reveals small-angle scatter from sub-resolution structures. Both have found many biomedical and engineering applications. The previously developed Unified Modulated Pattern Analysis (UMPA) model extracts these modalities from wavefront-marking data. We here present a new UMPA implementation, capable of rapidly processing large datasets and featuring capabilities to greatly extend the field of view. We also discuss possible artifacts and additional new features.
@article{arxiv.2211.01375,
title = {High-speed processing of X-ray wavefront marking data with the Unified Modulated Pattern Analysis (UMPA) model},
author = {Fabio De Marco and Sara Savatović and Ronan Smith and Vittorio Di Trapani and Marco Margini and Ginevra Lautizi and Pierre Thibault},
journal= {arXiv preprint arXiv:2211.01375},
year = {2023}
}