Height Fluctuations and Intermittency of $V_2 O_5$ Films by Atomic Force Microscopy
Statistical Mechanics
2015-06-24 v1
Abstract
The spatial scaling law and intermittency of the surface roughness by atomic force microscopy has been investigated. The intermittency of the height fluctuations has been checked by two different methods, first, by measuring scaling exponent of q-th moment of height-difference fluctuations i.e. and the second, by defining generating function and generalized multi-fractal dimension . These methods predict that there is no intermittency in the height fluctuations. The observed roughness and dynamical exponents can be explained by the numerical simulation on the basis of forced Kuramoto-Sivashinsky equation.
Keywords
Cite
@article{arxiv.cond-mat/0306035,
title = {Height Fluctuations and Intermittency of $V_2 O_5$ Films by Atomic Force Microscopy},
author = {A. Iraji zad and G. Kavei and M. Reza Rahimi Tabar and S. M. Vaez Allaei},
journal= {arXiv preprint arXiv:cond-mat/0306035},
year = {2015}
}
Comments
6 pages (two columns), 11 eps. figures, latex