English

First-principles identification of defect levels in Er-doped GaN

Materials Science 2017-10-30 v1

Abstract

Erbium (Er) doped GaN has been studied extensively for optoelectronic applications, yet its defect physics is still not well understood. In this work, we report a first-principles hybrid density functional study of the structure, energetics, and thermodynamic transition levels of Er-related defect complexes in GaN. We discover for the first time that ErGa_{\rm Ga}-CN_{\rm N}-VNV_{\rm N}, a defect complex of Er, a C impurity, and an N vacancy, and ErGa_{\rm Ga}-ON_{\rm N}-VNV_{\rm N}, a complex of Er, an O impurity, and an N vacancy, form defect levels at 0.18 and 0.46 eV below the conduction band, respectively. Together with ErGa_{\rm Ga}-VNV_{\rm N}, a defect complex of Er and an N vacancy which has recently been found to produce a donor level at 0.61 eV, these defect complexes provide explanation for the Er-related defect levels observed in experiments. The role of these defects in optical excitation of the luminescent Er center is also discussed.

Keywords

Cite

@article{arxiv.1710.09886,
  title  = {First-principles identification of defect levels in Er-doped GaN},
  author = {Khang Hoang},
  journal= {arXiv preprint arXiv:1710.09886},
  year   = {2017}
}

Comments

4 pages, 3 figures