We study a current shot noise in a macroscopic insulator based on a two-dimensional electron system in GaAs in a variable range hopping (VRH) regime. At low temperature and in a sufficiently depleted sample a shot noise close to a full Poissonian value is measured. This suggests an observation of a finite-size effect in shot noise in the VRH conduction and demonstrates a possibility of accurate quasiparticle charge measurements in the insulating regime.
@article{arxiv.1302.5185,
title = {Finite-size effect in shot noise in hopping conduction},
author = {E. S. Tikhonov and V. S. Khrapai and D. V. Shovkun and D. Schuh},
journal= {arXiv preprint arXiv:1302.5185},
year = {2015}
}