Two-dimensional (2D) materials are particularly attractive to build the channel of next-generation field-effect transistors (FETs) with gate lengths below 10-15 nm. Because the 2D technology has not yet reached the same level of maturity as its Silicon counterpart, device simulation can be of great help to predict the ultimate performance of 2D FETs and provide experimentalists with reliable design guidelines. In this paper, an ab initio modelling approach dedicated to well-known and exotic 2D materials is presented and applied to the simulation of various components, from thermionic to tunnelling transistors based on mono- and multi-layer channels. Moreover, the physics of metal - 2D semiconductor contacts is revealed and the importance of different scattering sources on the mobility of selected 2D materials is discussed. It is expected that modeling frameworks similar to the one described here will not only accompany future developments of 2D devices, but will also enable them.
@article{arxiv.2310.17724,
title = {Field-Effect Transistors based on 2-D Materials: a Modeling Perspective},
author = {Mathieu Luisier and Cedric Klinkert and Sara Fiore and Jonathan Backman and Youseung Lee and Christian Stieger and Áron Szabó},
journal= {arXiv preprint arXiv:2310.17724},
year = {2023}
}