Evolution of shot noise in suspended lithographic gold break junctions with bias and temperature

Shot noise is a powerful tool to probe correlations and microscopic transport details that conductance measurements alone cannot reveal. Even in atomic-scale Au devices that are well described by Landauer-B{\"u}ttiker physics, complications remain such as local heating and electron-phonon interactions. We report systematic rf measurements of shot noise in individual atomic-scale gold break junctions at multiple temperatures, with most bias voltages well above the energy of the Au optical phonon mode. Motivated by the previous experimental evidence that electron-phonon interactions can modify Fano factors and result in kinked features in bias dependence of shot noise, we find that the temperature dependence of shot noise from 4.2~K to 100~K is minimal. Enhanced Fano factors near 0.5$~G_0$ and features beyond simply linear bias dependence of shot noise near the 1$~G_0$ plateau are observed. Both are believed to have non-interacting origins and the latter likely results from slightly bias-dependent transmittance of the dominant quantum channel.