Euclid: Methodology for derivation of IPC-corrected conversion gain of nonlinear CMOS APS
Abstract
We introduce a fast method to measure the conversion gain in Complementary Metal-Oxide-Semiconductors (CMOS) Active Pixel Sensors (APS), which accounts for nonlinearity and interpixel capacitance (IPC). The standard 'mean-variance' method is biased because it assumes pixel values depend linearly on signal, and existing methods to correct for nonlinearity are still introducing significant biases. While current IPC correction methods are prohibitively slow for a per-pixel application, our new method uses separate measurements of the IPC kernel to make an almost instantaneous calculation of gain. Validated using test data from a flight detector from the ESA Euclid mission, the IPC correction recovers the results of slower methods within 0.1% accuracy. Meanwhile the nonlinearity correction ensures an estimation of the gain that is independent of signal, correcting a bias of more than 2.5% on gain estimation.
Keywords
Cite
@article{arxiv.2509.08810,
title = {Euclid: Methodology for derivation of IPC-corrected conversion gain of nonlinear CMOS APS},
author = {J. Le Graet and A. Secroun and M. Tourneur-Silvain and W. Gillard and N. Fourmanoit and S. Escoffier and E. Kajfasz and S. Kermiche and B. Kubik and J. Zoubian and S. Andreon and M. Baldi and S. Bardelli and P. Battaglia and D. Bonino and E. Branchini and M. Brescia and J. Brinchmann and A. Caillat and S. Camera and V. Capobianco and C. Carbone and J. Carretero and S. Casas and M. Castellano and G. Castignani and S. Cavuoti and A. Cimatti and C. Colodro-Conde and G. Congedo and C. J. Conselice and L. Conversi and Y. Copin and F. Courbin and H. M. Courtois and A. Da Silva and J. Dinis and M. Douspis and F. Dubath and C. A. J. Duncan and X. Dupac and S. Dusini and A. Ealet and M. Farina and S. Farrens and F. Faustini and S. Ferriol and M. Frailis and E. Franceschi and S. Galeotta and B. Gillis and C. Giocoli and F. Grupp and S. V. H. Haugan and W. Holmes and F. Hormuth and A. Hornstrup and P. Hudelot and K. Jahnke and M. Jhabvala and A. Kiessling and M. Kilbinger and R. Kohley and H. Kurki-Suonio and P. B. Lilje and V. Lindholm and I. Lloro and G. Mainetti and D. Maino and E. Maiorano and O. Mansutti and O. Marggraf and K. Markovic and N. Martinet and F. Marulli and R. Massey and E. Medinaceli and S. Mei and M. Meneghetti and G. Meylan and M. Moresco and L. Moscardini and S. -M. Niemi and J. W. Nightingale and C. Padilla and S. Paltani and F. Pasian and K. Pedersen and V. Pettorino and S. Pires and G. Polenta and M. Poncet and L. A. Popa and F. Raison and A. Renzi and J. Rhodes and G. Riccio and E. Romelli and M. Roncarelli and E. Rossetti and R. Saglia and D. Sapone and B. Sartoris and J. A. Schewtschenko and M. Schirmer and G. Seidel and M. Seiffert and C. Sirignano and G. Sirri and L. Stanco and J. Steinwagner and P. Tallada-Crespí and D. Tavagnacco and A. N. Taylor and H. I. Teplitz and I. Tereno and R. Toledo-Moreo and F. Torradeflot and I. Tutusaus and L. Valenziano and T. Vassallo and A. Veropalumbo and Y. Wang and J. Weller},
journal= {arXiv preprint arXiv:2509.08810},
year = {2026}
}