A mechanism of controlling the degree of strain relaxation in GeSn epilayers, grown by molecular beam epitaxy on Ge/Si(001) substrates, is reported in this work. It is demonstrated that by suitably controlling the thickness and the growth recipe of the underlying Ge buffer layer, both fully-strained and highly-relaxed GeSn epilayers can be obtained, without significant Sn segregation. The strain relaxation of the GeSn epilayer is mediated by threading dislocations of the Ge buffer layer, propagating across the Ge-GeSn interface. Systematic estimation of the threading dislocation density in both the alloy epilayer and the Ge buffer layer, by the approach developed by Benediktovich et al. [A. Benediktovitch, A. Zhylik, T. Ulyanenkova, M. Myronov, A. Ulyanenkov (2015), J. Appl. Cryst. 48, 655-665] supports this observation, and also reveals that no additional dislocations are generated at the Ge-GeSn interface. Together with recently reported techniques to arrest dislocation propagation in GeSn epilayers, these results bode extremely well for realization of highly-relaxed GeSn epilayers, much coveted for development of GeSn-based emitters.
@article{arxiv.1807.09718,
title = {Engineering strain relaxation of GeSn epilayers on Ge/Si(001) substrates},
author = {Krista R Khiangte and Jaswant S Rathore and Vaibhav Sharma and Apurba Laha and Suddhasatta Mahapatra},
journal= {arXiv preprint arXiv:1807.09718},
year = {2018}
}