Gallium oxide is an ultra-wide bandgap semiconductor with exceptional properties for power electronics and UV-C optoelectronics, but its behavior under illumination remains poorly understood. In this work, we investigate how optically generated self-trapped holes influence electrostatics and current conduction in gallium oxide devices. Using a vertical Schottky photodiode with a semi-transparent Ni anode, we performed capacitance-voltage, current-voltage, and temperature-dependent I-V measurements under dark and above-bandgap illumination. Analysis of photocurrent gain reveals that conventional image-force barrier-lowering models require unrealistically high interfacial electric fields, suggesting the presence of an alternative mechanism. By applying Fowler-Nordheim tunneling theory, we reconcile measured photocurrents and photo-capacitance results with physically plausible fields and quantify the two-dimensional concentration of self-trapped holes. Our findings demonstrate that illumination-induced charge significantly alters device electrostatics. Understanding this tunneling-based photocurrent gain mechanism is critical for designing gallium oxide devices for UV-C detectors and power electronics.
@article{arxiv.2603.26958,
title = {Electrostatic Effects of Self Trapped Holes in Gallium Oxide Devices},
author = {Nathan Wriedt and Joe McGlone and Davide Orlandini and Siddharth Rajan},
journal= {arXiv preprint arXiv:2603.26958},
year = {2026}
}