English

Electronic-Transport Properties of Al-Cu-Fe Thin Films

Materials Science 2007-05-23 v1
Authors: R. Haberkern , C. Roth , R. Knoefler , F. Zavaliche , P. Haeussler
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Abstract

Amorphous samples of Al-Cu-Fe were crystallized to the icosahedral phase under the control of electrical conductivity and thermopower at a rather small temperature of T=720 K. A comparison between different annealing states of the amorphous and the resulting quasicrystalline phase done on the same sample shows aston-ishing parallels in conductivity and large differences in thermopower.

Keywords

electronic transport Al-Cu-Fe thin films quasicrystalline phase thermopower annealing

Cite

@article{arxiv.cond-mat/9911371,
  title  = {Electronic-Transport Properties of Al-Cu-Fe Thin Films},
  author = {R. Haberkern and C. Roth and R. Knoefler and F. Zavaliche and P. Haeussler},
  journal= {arXiv preprint arXiv:cond-mat/9911371},
  year   = {2007}
}

Comments

4 pages, 4 figures, Conf. Proc. ICQ6 (Tokyo, 1997)

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