Electronic properties of ultra-thin YCrO3 films

Banabir Pal; Xiaoran Liu; Fangdi Wen; Mikhail Kareev; A. T. N Diaye; P. Shafer; E. Arenholz; Jak Chakhalian

doi:10.1063/1.5029977

Electronic properties of ultra-thin YCrO3 films

Materials Science 2018-08-01 v1

Authors: Banabir Pal , Xiaoran Liu , Fangdi Wen , Mikhail Kareev , A. T. N Diaye , P. Shafer , E. Arenholz , Jak Chakhalian

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Abstract

We report on the heteroepitaxial stabilization of YCrO3 ultra-thin films on LSAT (001) substrate. Using a combination of resonant X-ray absorption spectroscopy (XAS) and atomic multiplet cluster calculation, the electronic structure of YCrO3 thin film was investigated. Polarization dependent Cr L3,2 edge XAS measurement reveal the presence of an anomalous orbital polarization uncharacteristic of a 3d3 electronic system. Atomic multiplet calculations demonstrate the critical importance of charge transfer energy, Coulomb correlation strength and hopping interaction in stabilizing this unusual orbital polarized state likely connected to the bulk multiferroicity.

Keywords

ycro3 thin films electronic structure x-ray absorption spectroscopy orbital polarization atomic multiplet calculations multiferroicity

Cite

@article{arxiv.1804.08579,
  title  = {Electronic properties of ultra-thin YCrO3 films},
  author = {Banabir Pal and Xiaoran Liu and Fangdi Wen and Mikhail Kareev and A. T. N Diaye and P. Shafer and E. Arenholz and Jak Chakhalian},
  journal= {arXiv preprint arXiv:1804.08579},
  year   = {2018}
}

Electronic properties of ultra-thin YCrO3 films

Abstract

Keywords

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