We present a detailed electron diffraction study of individual single-walled carbon nanotubes. A novel sample preparation procedure provides well-separated, long and straight individual single-shell nanotubes. Diffraction experiments are carried out at 60kV, below the threshold for knock-on damage in carbon nanotubes. We describe experimental parameters that allow single-tube electron diffraction experiments with widely available thermal emission transmission electron microscopes. Further, we review the simulation of diffraction patterns for these objects.
@article{arxiv.cond-mat/0506356,
title = {Electron diffraction analysis of individual single-walled carbon nanotubes},
author = {Jannik C. Meyer and Matthieu Paillet and Georg S. Duesberg and Siegmar Roth},
journal= {arXiv preprint arXiv:cond-mat/0506356},
year = {2007}
}
Comments
10 pages, 10 figures. Ultramicroscopy (in press), 2005