Element- and site-specific resonant inelastic x-ray scattering spectroscopy (RIXS) is employed to investigate electron correlation effects in {NaV2O5}. In contrast to single photon techniques, RIXS at the vanadium L3 edge is able to probe d−d∗ transitions between V d-bands. A sharp energy loss feature is observed at -1.56 eV, which is well reproduced by a model calculation including correlation effects. The calculation identifies the loss feature as excitation between the lower and upper Hubbard bands and permits an accurate determination of the Hubbard interaction term U=3.0±0.2 eV.
@article{arxiv.cond-mat/0201497,
title = {Electron Correlation Effects in Resonant Inelastic X-ray Scattering of NaV2O5},
author = {G. P. Zhang and T. A. Callcott and G. T. Woods and L. Lin and Brian Sales and D. Mandrus and J. He},
journal= {arXiv preprint arXiv:cond-mat/0201497},
year = {2009}
}
Comments
15 pages, four figures, accepted to Phys. Rev. Lett