We show the developments carried out to improve the silicon sensor technology for the detection of soft X-rays with hybrid X-ray detectors. An optimization of the entrance window technology is required to improve the quantum efficiency. The LGAD technology can be used to amplify the signal generated by the X-rays and to increase the signal-to-noise ratio, making single photon resolution in the soft X-ray energy range possible. In this paper, we report first results obtained from an LGAD sensor production with an optimized thin entrance window. Single photon detection of soft X-rays down to 452~eV has been demonstrated from measurements, with a signal-to-noise ratio better than 20.
@article{arxiv.2210.12993,
title = {Development of LGAD sensors with a thin entrance window for soft X-ray detection},
author = {Jiaguo Zhang and Rebecca Barten and Filippo Baruffaldi and Anna Bergamaschi and Giacomo Borghi and Maurizio Boscardin and Martin Brueckner and Maria Carulla and Matteo Centis Vignali and Roberto Dinapoli and Simon Ebner and Francesco Ficorella and Erik Froejdh and Dominic Greiffenberg and Omar Hammad Ali and Julian Heymes and Shqipe Hasanaj and Viktoria Hinger and Thomas King and Pawel Kozlowski and Carlos Lopez-Cuenca and Davide Mezza and Konstantinos Moustakas and Aldo Mozzanica and Giovanni Paternoster and Sabina Ronchin and Christian Ruder and Bernd Schmitt and Dhanya Thattil},
journal= {arXiv preprint arXiv:2210.12993},
year = {2022}
}