Low-Gain Avalanche Diode (LGAD) sensors, offering timing resolutions of the order of tens of picoseconds, are being widely adopted in particle physics experiments and related applications. As these applications scale to large numbers of sensors with varying pixel geometries, conventional manual characterization techniques become inadequate for large-scale quality control. We present a modular probe card system for automated electrical characterization of pixelated LGAD sensors, consisting of a probe card, a switching board, precision measurement instruments, and control software. The system supports flexible pixel selection and measurement. Its performance is demonstrated through current-voltage (I-V) and capacitance-voltage (C-V) measurements of a 16×16 LGAD array. A rapid row-wise I-V scan of the full array is completed in approximately 20 minutes, while a pixel-by-pixel I-V scan from 0 to 300 V with a 1 V step requires about 340 minutes. The switching matrix introduces less than 1 nA of leakage current even in a conservative worst-case configuration, remaining small compared with the leakage current of a normal LGAD pixel. The modular architecture and automation capability make the system a practical and scalable solution for large-scale LGAD sensor quality control and distributed testing environments.
@article{arxiv.2605.23401,
title = {Development of a system for testing full-size CMS LGAD sensors},
author = {Kyungmin Lee and Hoyong Jeong and Junho Kim and Seokhyeon Lee and Jaebak Kim and Jae Hyeok Yoo},
journal= {arXiv preprint arXiv:2605.23401},
year = {2026}
}