A simple and novel setup for high-frequency dielectric spectroscopy of materials has been developed using a portable vector network analyzer. The measurement principle is based on radio-frequency reflectometry, and both its capabilities and limitations are discussed. The results obtained on a typical liquid crystal prove that the device can provide reliable spectra between 107 Hz and 109 Hz, thus extending the capabilities of conventional impedance analyzers.
@article{arxiv.2402.00498,
title = {Development of a high-frequency dielectric spectrometer using a portable vector network analyzer},
author = {Aitor Erkoreka and Josu Martinez-Perdiguero},
journal= {arXiv preprint arXiv:2402.00498},
year = {2024}
}