Dephasing in semiconductor-superconductor structures by coupling to a voltage probe
Abstract
We study dephasing in semiconductor-superconductor structures caused by coupling to a voltage probe. We consider structures where the semiconductor consists of two scattering regions between which partial dephasing is possible. As a particular example we consider a situation with a double-barrier junction in the normal region. For a single-mode system we study the conductance both as a function of the position of the Fermi level and as a function of the barrier transparency. At resonance, where the double-barrier is fully transparent, we study the suppression of the ideal factor-of-two enhancement of the conductance when a finite coupling to the voltage probe is taken into account.
Keywords
Cite
@article{arxiv.cond-mat/9909029,
title = {Dephasing in semiconductor-superconductor structures by coupling to a voltage probe},
author = {Niels Asger Mortensen and Antti-Pekka Jauho and Karsten Flensberg},
journal= {arXiv preprint arXiv:cond-mat/9909029},
year = {2007}
}
Comments
13 pages including 3 figures. Accepted for publication in Superlattices and Microstructures