Demonstration of a genetic-algorithm-optimized cavity-based waveguide crossing
Applied Physics
2017-12-12 v1 Optics
Abstract
A compact, single-etch silicon photonics waveguide crossing based on low quality factor cavity and optimized by a genetic algorithm is demonstrated. The device has 0.1~0.3 dB insertion loss and < -35 dB crosstalk per crossing for fundamental TE mode in the 1550-1600 nm wavelength band, with a footprint of 5 x 5 {\mu}m.
Cite
@article{arxiv.1712.03743,
title = {Demonstration of a genetic-algorithm-optimized cavity-based waveguide crossing},
author = {Pengfei Xu and Yanfeng Zhang and Zengkai Shao and Yujie Chen and Siyuan Yu},
journal= {arXiv preprint arXiv:1712.03743},
year = {2017}
}
Comments
7 pages, 6 figures