We report on the characterization of near-ultraviolet high density silicon photomultiplier (\SiPM) developed at Fondazione Bruno Kessler (\FBK) at cryogenic temperature. A dedicated setup was built to measure the primary dark noise and correlated noise of the \SiPMs\ between 40 and 300~K. Moreover, an analysis program and data acquisition system were developed to allow the precise characterization of these parameters, some of which can vary up to 7 orders of magnitude between room temperature and 40~K. We demonstrate that it is possible to operate the \FBK\ near-ultraviolet high density \SiPMs\ at temperatures lower than 100~K with a dark rate below 0.01 cps/mm2 and total correlated noise probability below 35\% at an over-voltage of 6~V. These results are relevant for the development of future cryogenic particle detectors using \SiPMs\ as photosensors.
@article{arxiv.1610.01915,
title = {Cryogenic Characterization of FBK HD Near-UV Sensitive SiPMs},
author = {Fabio Acerbi and Stefano Davini and Alessandro Ferri and Cristiano Galbiati and Graham Giovanetti and Alberto Gola and George Korga and Andrea Mandarano and Marco Marcante and Giovanni Paternoster and Claudio Piemonte and Alessandro Razeto and Veronica Regazzoni and Davide Sablone and Claudio Savarese and Gaetano Zappalá and Nicola Zorzi},
journal= {arXiv preprint arXiv:1610.01915},
year = {2017}
}