Controlling the quality factor of a tuning-fork resonance between 9 K and 300 K for scanning-probe microscopy

Georgios Ctistis; Eric Frater; Simon R. Huisman; Jeroen P. Korterik; Jennifer L. Herek; Willem L. Vos; Pepijn W. H. Pinkse

doi:10.1088/0022-3727/44/37/375502

Controlling the quality factor of a tuning-fork resonance between 9 K and 300 K for scanning-probe microscopy

Optics 2011-08-31 v2 Mesoscale and Nanoscale Physics

Authors: Georgios Ctistis , Eric Frater , Simon R. Huisman , Jeroen P. Korterik , Jennifer L. Herek , Willem L. Vos , Pepijn W. H. Pinkse

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Abstract

We study the dynamic response of a mechanical quartz tuning fork in the temperature range from 9 K to 300 K. Since the quality factor Q of the resonance strongly depends on temperature, we implement a procedure to control the quality factor of the resonance. We show that we are able to dynamically change the quality factor and keep it constant over the whole temperature range. This procedure is suitable for applications in scanning probe microscopy.

Keywords

quartz tuning fork quality factor scanning probe microscopy dynamic response temperature dependence

Cite

@article{arxiv.1103.5892,
  title  = {Controlling the quality factor of a tuning-fork resonance between 9 K and 300 K for scanning-probe microscopy},
  author = {Georgios Ctistis and Eric Frater and Simon R. Huisman and Jeroen P. Korterik and Jennifer L. Herek and Willem L. Vos and Pepijn W. H. Pinkse},
  journal= {arXiv preprint arXiv:1103.5892},
  year   = {2011}
}

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5 pages, 6 figures

Controlling the quality factor of a tuning-fork resonance between 9 K and 300 K for scanning-probe microscopy

Abstract

Keywords

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