English

Conductance Quantization in Schottky-gated Si/SiGe Quantum Point Contacts

Mesoscale and Nanoscale Physics 2009-11-11 v1

Abstract

We report on the fabrication and electronic transport characterisation of Schottky-gated strongly confined Si/SiGe quantum point contacts (QPC). At zero magnetic field and T=450mK the QPC conductance as a function of gate voltage shows a quantization in units of e^2/h, indicative of transport through 1D modes which appear to lack both spin and valley degeneracy.

Keywords

Cite

@article{arxiv.cond-mat/0609111,
  title  = {Conductance Quantization in Schottky-gated Si/SiGe Quantum Point Contacts},
  author = {G. Scappucci and L. Di Gaspare and E. Giovine and A. Notargiacomo and R. Leoni and F. Evangelisti},
  journal= {arXiv preprint arXiv:cond-mat/0609111},
  year   = {2009}
}

Comments

2 pages, 2 figure, to be published in Proc. ICPS-28

R2 v1 2026-07-22T11:36:47.710Z