Materials Science · Physics
Elucidation of the atomic-scale mechanism of the anisotropic oxidation rate of 4H-SiC between the ($0001$) Si-face and ($000\overline{1}$) C-face by using a new Si-O-C interatomic potential
So Takamoto, Takahiro Yamasaki, Takahisa Ohno, Chioko Kaneta +2
2018-05-23
Materials Science · Physics
An Unexpected Role of H During SiC Corrosion in Water
Jianqi Xi, Cheng Liu, Dane Morgan, Izabela Szlufarska
2021-04-01
Materials Science · Physics
Modeling the Initial Stages of Si(100) Thermal Oxidation: An Ab-initio Approach
Lukas Cvitkovich, Dominic Waldhör, Al-Moatassem El-Sayed, Markus Jech +2
2023-02-15
Materials Science · Physics
The interface between silicon and a high-k oxide
Clemens J. Foerst, Christopher R. Ashman, Karlheinz Schwarz, Peter E. Bloechl
2007-05-23
Materials Science · Physics
Modelling atomic and nanoscale structure in the silicon-oxygen system through active machine learning
Linus C. Erhard, Jochen Rohrer, Karsten Albe, Volker L. Deringer
2025-04-16
Materials Science · Physics
Atomic-Scale Dynamics of the Formation and Dissolution of Carbon Clusters in SiO2
Sanwu Wang, Massimiliano Di Ventra, S. G. Kim, Sokrates T. Pantelides
2009-11-07
Applied Physics · Physics
Combustion Behaviour of Single Silicon Particles in Different Oxidizing Environments
Herman, Heng, Hugo Keck, Christian Chauveau +3
2025-09-30
Materials Science · Physics
Atomic bonding and electrical potential at metal/oxide interfaces, a first principle study
Eric Tea, Jianqiu Huang, Guanchen Li, Celine Hin
2017-04-26
Materials Science · Physics
Accurate Modeling of Gate Leakage Currents in SiC Power MOSFETs
Ang Feng, Alexander Karl, Dominic Waldhör, Marina Avramenko +2
2025-12-03
Materials Science · Physics
Structure and energetics of carbon-related defects in SiC (0001)/SiO$_{\rm 2}$ systems revealed by first-principles calculations: Defects in SiC, SiO$_{\rm 2}$, and just at their interface
Takuma Kobayashi, Yu-ichiro Matsushita
2019-10-15
Materials Science · Physics
Silicon Oxide is a Non-Innocent Surface for Molecular Electronics and Nanoelectronics Studies
Jun Yao, Lin Zhong, Douglas Natelson, James M. Tour
2011-02-17
Materials Science · Physics
First principles study of oxidation of Si segregated {\alpha}-Ti(0001) surfaces
Somesh Kr. Bhattacharya, Ryoji Sahara, Tomonori Kitashima, Kyosuke Ueda +1
2017-12-06
Materials Science · Physics
Stress-driven oxidation chemistry of wet silicon surfaces
Lucio Colombi Ciacchi, Daniel J. Cole, Mike C. Payne, Peter Gumbsch
2009-04-15
Soft Condensed Matter · Physics
Atomic layering at the liquid silicon surface: a first- principles simulation
G. Fabricius, E. Artacho, D. Sanchez-Portal, P. Ordejon +2
2009-10-31
Materials Science · Physics
Composition effect in the thermo-mechanical behavior of glasses, and its modelization
Rene Alvarez-Donado, Matias Sepulveda-Macias, Anne Tanguy
2025-07-18
Disordered Systems and Neural Networks · Physics
Amorphous silica at surfaces and interfaces: simulation studies
Juergen Horbach, Torsten Stuehn, Claus Mischler, Walter Kob +1
2007-05-23
Materials Science · Physics
Oxidation kinetics and non-Marcusian charge transfer in dimensionally confined semiconductors
Ning Xu, Li Shi, Xudong Pei, Weiyang Zhang +7
2023-07-19
Materials Science · Physics
Influence of polarizability on metal oxide properties studied by molecular dynamics simulations
Philipp Beck, Peter Brommer, Johannes Roth, Hans-Rainer Trebin
2012-11-13