High-resolution dynamic X-ray detector is crucial for time-resolved digital radiography (DR) imaging and fast 3D medical computed tomography (CT) imaging. Recently, perovskites have become promising alternatives to conventional semi-conductor materials, e.g., Si, a-Se and CdTe, for direct X-ray detection. However, the feasibility of their combination with high-speed pixelated complementary metal-oxide-semiconductor (CMOS) arrays remains unknown. This work originally reports an innovative direct-conversion X-ray detector fabricated with 300 micrometer thick inorganic perovskite film printed on a tailored CMOS array. In-house measurements demonstrate that the CsPbBr3 film has excellent optoelectric properties of an electron mobility-lifetime product of 3.40x10−5 cm2 V−1, and the X-ray detector exhibits high sensitivity of 9341uC Gyair−1 cm−2, and low detection limit of 588 nGyair−1. This CMOS X-ray imaging detector achieves a high spatial resolution up to 5.5 lp/mm (close to the resolution limit of 6.0 lp/mm), and >300 frame per second (fps) readout speed. DR image of a resolution pattern phantom and a anesthesia mice, CT images of a biological specimen are acquired for the first time.
@article{arxiv.2210.02073,
title = {CMOS based high-resolution dynamic X-ray imaging with inorganic perovskite},
author = {Yanliang Liu and Chaosong Gao and Jiongtao Zhu and Xin Zhang and Meng Wu and Ting Su and Jiahong Wang and Zonghai Sheng and Wenjun Liu and Tongyu Shi and Xingchen He and Dong Liang and Hairong Zheng and Xue-Feng Yu and Xiangming Sun and Yongshuai Ge},
journal= {arXiv preprint arXiv:2210.02073},
year = {2022}
}