A CdTe double-sided strip detector (CdTe-DSD) is an ideal device for imaging and spectroscopic measure- ments in the hard X-ray range above 10 keV. Recent development enables us to realize an imager with a detection area of ~10 cm2. An energy resolution of 1-2 keV (FWHM) and a position resolution of a few hundred {\mu}m are available from the detector. This type of imager has been long awaited for non-destructive elemental analysis, especially by using negative muons, because energies of characteristic X-rays from muonic atoms are about 200 time higher than those from normal atoms. With the method that uses negative muons, hard X-ray information gives the spatial distribution of elements in samples at a certain depth defined by the initial momentum of the muon beam. In order to study three-dimensional imaging capability of the method, we have developed a compact imaging system based on CdTe-DSD and a {\phi}3 mm pinhole collimator as the first prototype. We conducted experiments with samples which consist of layers of Al, BN and LiF irradiated by negative muon beams in MUSE/J-PARC and successfully reconstruct hard X-ray images of muonic X-rays from B, N and F at various depths.
@article{arxiv.1711.05966,
title = {A compact imaging system with a CdTe double-sided strip detector for non-destructive analysis using negative muonic X-rays},
author = {Miho Katsuragawa and Motonobu Tampo and Koji Hamada and Atsushi Harayama and Yasuhiro Miyake and Sayuri Oshita and Goro Sato and Tadayuki Takahashi and Shin'ichiro Takeda and Shin Watanabe and Goro Yabu},
journal= {arXiv preprint arXiv:1711.05966},
year = {2017}
}