Characterization of XIA UltraLo-1800 Response to Measuring Charged Samples

Joshua Ange; Robert Calkins; Andrew Posada

doi:10.1088/1748-0221/18/01/P01027

Characterization of XIA UltraLo-1800 Response to Measuring Charged Samples

Instrumentation and Detectors 2023-02-01 v2

Authors: Joshua Ange , Robert Calkins , Andrew Posada

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Abstract

Commercial alpha counters are used in science and industry applications to screen materials for surface radon progeny contamination. In this paper, we characterize an XIA UltraLo-1800, an ionization drift alpha counter, and study the response to embedded charge in polyethylene sample measurements. We show that modeling such effects is possible in a Geant4-based simulation framework and attempt to derive corrections. This paper also demonstrates the effectiveness of the use of an anti-static fan to eliminate the embedded charge and recover a 97.73% alpha detection efficiency in the alpha counter.

Keywords

alpha counter XIA UltraLo-1800 embedded charge polyethylene sample Geant4 simulation anti-static fan detection efficiency

Cite

@article{arxiv.2209.08002,
  title  = {Characterization of XIA UltraLo-1800 Response to Measuring Charged Samples},
  author = {Joshua Ange and Robert Calkins and Andrew Posada},
  journal= {arXiv preprint arXiv:2209.08002},
  year   = {2023}
}

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