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Capacitance of Silicon Pixels

High Energy Physics - Experiment 2008-11-26 v1

Abstract

Capacitance measurements have been made on silicon pixel sensors of types n+ on n, p+ on n, and n+ on p. The arrays test a variety of implant and gap widths, and the n+ on n devices test several p-stop designs. The measurements examine inter-pixel and backplane contributions and include studies of temperature dependence. Measurements were made before and after irradiation with fluences relevant to LHC experiments and Fermilab Tevatron Run 2.

Keywords

Cite

@article{arxiv.hep-ex/0003032,
  title  = {Capacitance of Silicon Pixels},
  author = {Grant Gorfine and Martin Hoeferkamp and Geno Santistevan and Sally Seidel},
  journal= {arXiv preprint arXiv:hep-ex/0003032},
  year   = {2008}
}

Comments

28 pages including 22 figures