Analysis of silicon nitride partial Euler waveguide bends
Abstract
In this work we present a detailed analysis of individual loss mechanisms in silicon nitride partial Euler bends at a wavelength of 850 nm. This structure optimizes the transmission through small radii optical waveguide bends. The partial Euler bend geometry balances losses arising from the transition from the straight to the bend waveguide mode, and radiative losses of the bend waveguide mode. Numerical analyses are presented for 45-degree bends commonly employed in S-bend configurations to create lateral offsets, as well as 90- and 180-degree bends. Additionally, 90-degree partial Euler bends were fabricated on a silicon nitride photonic platform to experimentally complement the theoretical findings. The optimized waveguide bends allow for a reduced effective radius without increasing the total bend loss and, thus, enable a higher component density in photonic integrated circuits.
Cite
@article{arxiv.1910.07257,
title = {Analysis of silicon nitride partial Euler waveguide bends},
author = {Florian Vogelbacher and Stefan Nevlacsil and Martin Sagmeister and Jochen Kraft and Karl Unterrainer and Rainer Hainberger},
journal= {arXiv preprint arXiv:1910.07257},
year = {2019}
}
Comments
This research has received funding through the grant PASSION (No. 850649) from the Austrian Research Promotion Agency (FFG) and European Union's Horizon 2020 research and innovation programme under the grant OCTCHIP (No. 688173)