A system for measuring auto- and cross-correlation of current noise at low temperatures

L. DiCarlo; Y. Zhang; D. T. McClure; C. M. Marcus; L. N. Pfeiffer; K. W. West

doi:10.1063/1.2221541

A system for measuring auto- and cross-correlation of current noise at low temperatures

Mesoscale and Nanoscale Physics 2009-11-11 v2

Authors: L. DiCarlo , Y. Zhang , D. T. McClure , C. M. Marcus , L. N. Pfeiffer , K. W. West

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Abstract

We describe the construction and operation of a two-channel noise detection system for measuring power and cross spectral densities of current fluctuations near 2 MHz in electronic devices at low temperatures. The system employs cryogenic amplification and fast-Fourier-transform based spectral measurement. The gain and electron temperature are calibrated using Johnson noise thermometry. Full shot noise of 100 pA can be resolved with an integration time of 10 s. We report a demonstration measurement of bias-dependent current noise in a gate defined GaAs/AlGaAs quantum point contact.

Keywords

noise detection cross-correlation low temperatures current noise Johnson noise thermometry quantum point contact shot noise

Cite

@article{arxiv.cond-mat/0604018,
  title  = {A system for measuring auto- and cross-correlation of current noise at low temperatures},
  author = {L. DiCarlo and Y. Zhang and D. T. McClure and C. M. Marcus and L. N. Pfeiffer and K. W. West},
  journal= {arXiv preprint arXiv:cond-mat/0604018},
  year   = {2009}
}

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A system for measuring auto- and cross-correlation of current noise at low temperatures

Abstract

Keywords

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