Atomically thin two-dimensional (2D) materials provide a wide range of basic building blocks with unique properties, making them ideal for heterogeneous integration with a mature chip platform for advances in optical communication technology. Control and understanding of the precise value of the optical index of these materials, however, is challenging, due to the small lateral flake dimension. Here we demonstrate a semi-empirical method to determine the index of a 2D material (nMoTe2 of 4.36+0.011i) near telecommunication-relevant wavelength by integrating few layers of MoTe2 onto a micro-ring resonator. The placement, control, and optical-property understanding of 2D materials with integrated photonics paves a way for further studies of active 2D material-based optoelectronics and circuits.
@article{arxiv.1811.05323,
title = {A semi-empirical integrated microring cavity approach for 2D material optical index identification at 1.55 {\mu}m},
author = {Rishi Maiti and Rohit A. Hemnani and Rubab Amin and Zhizhen Ma and Mohammad H. Tahersima and Tom A. Empante and Hamed Dalir and Ritesh Agarwal and Ludwig Bartels and Volker J. Sorger},
journal= {arXiv preprint arXiv:1811.05323},
year = {2019}
}
Comments
arXiv admin note: substantial text overlap with arXiv:1807.03945