A Percolative Model of Soft Breakdown in Ultrathin Oxides
Condensed Matter
2009-11-07 v1
Abstract
The degradation of ultrathin oxide layers in the presence of a stress voltage is modeled in terms of two antagonist percolation processes taking place in a random resistor network. The resistance and leakage current fluctuations are studied by MonteCarlo simulations for voltages below the breakdown threshold. An increase of excess noise together with a noticeable non-Gaussian behavior is found in the pre-breakdown regime in agreement with experimental results.
Keywords
Cite
@article{arxiv.cond-mat/0204586,
title = {A Percolative Model of Soft Breakdown in Ultrathin Oxides},
author = {C. Pennetta and L. Reggiani and Gy. Trefan},
journal= {arXiv preprint arXiv:cond-mat/0204586},
year = {2009}
}
Comments
accepted for publication on Physica B