A high-performance Scintillator Ion Beam Monitor (SIBM) provides diagnostics across a range of isotopes, energies, and intensities employing a machine-vision camera with two novel scintillator targets movable into/out of the beam without breaking vacuum. Scintillators are: 1) a semicrystalline polymer material (PM) film, 1-200 microns thick; 2) A 100-400 micron thick opaque wafer consisting of a hybrid of inorganic-polymer (HM) plastic matrix. The SIBM was demonstrated at the Facility of Rare Isotope Beams (FRIB, East Lansing, MI) real-time beam profile and rate analysis spanning more than five orders of magnitude including visualization of single ion signals. It may replace FRIB reference detectors: Faraday cup, silicon strips and a micro-channel plate.
@article{arxiv.2208.14853,
title = {A High Performance Scintillator Ion Beam Monitor},
author = {Daniel S Levin and Peter S. Friedman and Tom Ginter and Claudio Ferretti and Alexander Kaipainen and Nicholas Ristow},
journal= {arXiv preprint arXiv:2208.14853},
year = {2022}
}
Comments
Submitted to the 11th International Beam Instrumentation Conference (IBIC 2022)