Transient field-resolved reflectometry at 50-100 THz
Abstract
Transient field-resolved spectroscopy enables studies of ultrafast dynamics in molecules, nanostructures, or solids with sub-cycle resolution, but previous work has so far concentrated on extracting the dielectric response at frequencies below 50\,THz. Here, we implemented transient field-resolved reflectometry at 50-100\,THz (3-6\,m) with MHz repetition rate employing 800\,nm few-cycle excitation pulses that provide sub-10\,fs temporal resolution. The capabilities of the technique are demonstrated in studies of ultrafast photorefractive changes in the semiconductors Ge and GaAs, where the high frequency range permitted to explore the resonance-free Drude response. The extended frequency range in transient field-resolved spectroscopy can further enable studies with so far inaccessible transitions, including intramolecular vibrations in a large range of systems.
Cite
@article{arxiv.2107.00294,
title = {Transient field-resolved reflectometry at 50-100 THz},
author = {M. Neuhaus and J. Schötz and M. Aulich and A. Srivastava and D. Kimbaras and V. Smejkal and V. Pervak and M. Alharbi and A. M. Azeer and F. Libisch and C. Lemell and J. Burgdörfer and Z. Wang and M. F. Kling},
journal= {arXiv preprint arXiv:2107.00294},
year = {2021}
}
Comments
11 pages, 5 figures