Terahertz radiation due to random grating coupled surface plasmon polaritons
Abstract
We report on terahertz (THz) radiation under electrical pumping from a degenerate semiconductor possessing an electron accumulation layer. In InN, the random grating formed by topographical defects provides high-efficiency coupling of surface plasmon polaritons supported by the accumulation layer to the THz emission. The principal emission band occupies the 2-6 THz spectral range. We establish a link between the shape of emission spectra and the structural factor of the random grating and show that the change of slope of power dependencies is characteristic for temperature-dependent plasmonic mechanisms. The super-linear rise of a THz emission intensity on applied electric power provides advantage of such materials in emission yield.
Cite
@article{arxiv.1008.0251,
title = {Terahertz radiation due to random grating coupled surface plasmon polaritons},
author = {T. V. Shubina and N. A. Gippius and V. A. Shalygin and A. V. Andrianov and S. V. Ivanov},
journal= {arXiv preprint arXiv:1008.0251},
year = {2015}
}
Comments
4 pages, 4 figures